CPROGRAM

Programme
Experimental methods in X-ray and neutron structure analysis
Ostravice 2002

		M. Rieder, J. Fiala
14.15	Jaroslav Bradler Institute of Physic, Academy of Sciences, Praha	X-ray sources
	Nikolaj Ganev Czech Technical University, Praha	Detectors of X-rays and neutrons
	Jiri Kulda ILL, Grenoble, Francie	Neutron scattering

		J. Hašek, I. Cisarova
8.30	Jaromír Marek Masaryk University, Brno	Single crystal structure analysis - introduction
	Jiri Hybler Institute of Physic, Academy of Sciences, Praha	Single crystal film methods
	Michal Dušek Institute of Physic, Academy of Sciences, Praha	Single crystal diffractometry – four-circle diffractometer

		A. Buchal,. M. Cernansky
11.50	Radomír Kužel, David Rafaja Charles University, Praha	Powder diffractometry I

		A. Buchal,. M. Cernansky
14.00	Radomír Kužel, David Rafaja Charles University, Praha	Powder diffractometry II
	Zdenek Weiss, Milan Rieder TU Ostrava, UK Praha	Sample preparation for powder diffraction
	Jaroslav Fiala University of West Bohemia, Plzen	Quantitative phase analysis
	Jaroslav Fiala University of West Bohemia, Plzen	X-ray topography of polycrystalline materials
	Nikolaj Ganev Czech Technical University, Praha	X-ray tensometry

19.00 Dinner
20.00 Meeting of regional IUCr committee and scientific board of CSCA

		Z. Weiss, N. Ganev
8.30	Jiří Marek Czech Technical University, Praha	Study of textures
	Jiří Zeman VTÚO Brno	Texture of metastable austenite
	Petr Lukáš Institute of Nuclear Physics, Rez near Prague	Use of neutron diffraction methods in materials reasearch
	Miloš Steinhart Institute of Macromolecular Chemistry, Academy of Sciences, Praha Pavel Strunz Institute of Nuclear Physics, Rez near Prague	Small angle scattering of X-rays and neutrons
	Václav Holý Masaryk University, Brno	Diffuse scattering
	Jiri Kub Institute of Physic, Academy of Sciences, Praha	X-ray holography

		R. Kužel, J. Kub
8.30	Jaromír Hrdý Institute of Physic, Academy of Sciences, Praha	Monochromatization of X-rays
9.30	Zbynek Šourek Institute of Physic, Academy of Sciences, Praha	Multiple-crystal diffractometry
	Milena Polcarová Institute of Physic, Academy of Sciences, Praha	X-ray topography

		J. Brynda, J. Hasek
11.10		Introduction to crystallization techniques
	Ivana Kutá Smatanová University of West Bohemia, Ceske Budejovice	Crystallization of biological macromolecules
	Pavlína Rezácová Institute of molecular genetics, Academy of Sciences, Praha	Cryo-crystallography of proteins

		J. Marek, P. Capková
14.00	Jiri Brynda Institute of molecular genetics, Academy of Sciences, Praha	Protein diffractometer
	Eva Buchtelová Charles University, Praha	Neutron crystallography on biological molecules
	Jindřich Hašek Institute of Macromolecular Chemistry, Academy of Sciences, Praha	Protein crystallography with synchrotron radiation
	Karel Prokeš Charles University, Praha	Neutron diffraction study of magnetic structures
	Michal Dušek Institute of Physic, Academy of Sciences, Praha	Study of modulated structures
	Miroslav Šlouf Institute of Macromolecular Chemistry, Academy of Sciences, Praha	Charge density studies

		J. Kubena, Z. Šourek
8.30	Zdeněk Bochnícek Masaryk University, Brno	Optical reflection of X-ray radiation and its use for study of structure and thermal stability of thin films
	David Rafaja, Radomír Kužel Charles University, Praha	Structure of surfaces, thin films and multilayers
	Pavel Klang Masaryk University, Brno	X-ray diffraction on structural defects in silicon
	Miloš Steinhart Institute of Macromolecular Chemistry, Academy of Sciences, Praha	High-pressure diffractometry
	Antonín Buchal Technical University, Brno	High-temperature diffractometry
	Milan Dopita Charles University, Praha	Low-temperature diffractometry

18.30	František Eichler Liberec	Qualitative and quantitative identification of industrial dust
18.45	Ondrej Pritula UACH SAV, Bratislava	Quantitative X-ray phase analysis od industrial products

Emilie Těšínská:	Objev neutronů a první odezvy v českých zemích
J. Marek, Z. Trávníček	J. Marek, Z. Trávníček: Monokrystalová rentgenová strukturní analýza

H. Petříčková, M. Hušák, J. Čejka, B. Kratochvíl, I. Císařová, A. Jegorov:	X-Ray Structure Analysis of Dihydroergocrustine Mesylates
B. Klepetarová	Rentgenová strukturní analýza kalcinovaného dodecasilu-3C
K. Mrkvová, J. Kameníček	X-ray structure of (MetPPh3)(Cobdt2)
Miroslav Pospíšil	Strukturní analýza interkalovaných silikátů s využitím modelování a práškové difrakce
B. Koudelka	Strukturní analýza interkalátů; Program SUPRAMOL.
A. Ševčíková	Příprava a charakterizace stronciumsulfoaluminátu
P. Mikulík	Advanced X-ray Diffraction Imaging Techniques for Semiconductor Wafer Characterisation
Z. Budínská	Development and analysis of superlattice coatings
V. Ryukhtin	Comparative study of porosity in 3Y-TZP superplastic ceramics by USANS and SEM image analysis

L. Čaplovič	Sledovanie vplyvu technologických parametrov na vlastnosti elektrografitu
R. Kužel, J. Lhotka, G. Cappuccio, V. Valvoda	Thickness determination of thin polycrystalline film by low-angle incidence X-ray diffraction
D. Šimek, R. Kužel, F. Kunc	Fitting of the reciprocal space maps for stressed and textured thin films
M. Dopita, D. Rafaja and V. Ucakar	Microstructure of Functionally Graded Materials and Thin Films Studied by X - ray Diffraction
S. Daniš, P. Javorský, D. Rafaja a V. Sechovský	Magnetoelastické vlastnosti intermetalických sloučenin Er(Co_1-xSi_x)₂ a Er(Co_1-xGe_x)₂

P. Řezáčová	Structural basis of the HIV-1 and HIV-2 inhibition by a monoclonal antibody.
K. Teubner	Struktura modifikací dihydrogenfosforečnanu 1-methylpiperazinia(2+)

Monochromatization of X-rays

Multiple-crystal diffractometry

X-ray topography