Conference Programme
Arrival and registration
- 11.30
- Lunch
- 12.30
- Opening ceremony
- 12.40
- J. Fiala :
Introduction to the topic and problem
- 13.15
- A.C. Vermeulen, R. Delhez, Th.H. de Keijser, E.J. Mittemeijer :
Diffraction-line broadening analysis of strain fields
in crystalline solids
- 15.15
- P. Klimanek:
Structure models of diffraction line broadening effects
- 16.00
- Break
- 16.30
- H.J. Bunge: Texture analysis
- 17.15
- I. Kraus, N. Ganev
X-ray analysis of inhomogeneous stress state (still uncertain)
- 18.00
- Commercial Presentations (Seifert-Roentgen, Philips)
- 19.30
- Get-together party
- 7.00
- Breakfast
- 8.00
- R.L. Snyder:
Correcting observed diffraction patterns for
instrumental aberrations
- 8.45
- V. Valvoda:
Influence of preferred orientation on X-ray powder
diffraction
- 9.30
- Break
- 10.00
- T. Yamanaka:
Analysis of diffuse scattering in powder diffraction
induced from pressure and temperature
- 10.45
- M. Cernansky:
Mathematical treatment of powder diffraction line
profiles
- 11.30
- Lunch
- 12.30
- Poster session A
- 14.00
- D. Balzar:
Diffraction line broadening analysis
- 14.45
- P.F. Fewster:
A Detailed
Strain Analysis in Al2O3 Powder
P. Scardi, F.C. Matacotta, V.A. Dediu
Line Profile Analysis of HTc Superconducting Thin Films
D. Machajdík, K. Fröhlich, A.P. Kobzev, F. Weiss
X-Ray and RBS Study of Thin SrTiO3 film Deposited on (100) MgO Monocrystal Substrate
P. Mikula, P. Lukás, J. Saroun, M. Vrána, V. Wagner
Modifications in Neutron Bragg Diffraction Techniques for Strain-Stress Measurements in Polycrystalline Materials
- 17.15
- Seifert - FPM, exhibition, software presentation
- 19.30
- Concert - folk music
- 7.00
- Breakfast
- 8.00
- T. Ungar:
The dislocation based model of X-ray line broadening,
scrutinised by experiment
- 8.45
- H. Bradaczek:
Paracrystallinity
- 9.30
- Break
- 10.00
- A.I. Ustinov:
Effect of planar deffects in crystals on the position
and profile of powder diffraction maxima
- 10.45
- Z. Weiss, P. Capkova:
Effect of stacking disorder on the powder diffraction
line profile
- 11.30
- Lunch
- 13.00
- Excursion
- 7.00
- Breakfast
- 8.00
- W. Wilke:
The model of paracrystal and its application to polymers
- 8.45
- R. Somashekar:
Crystal size and distortion parameters in fibers using WAXS
- 9.30
- Break
- 10.00
- C.R. Houska, R. Kuzel:
Analytic functions describing line profiles influenced
by size distribution, strain and stacking faults
- 10.45
- G. Kimmel:
Broadening effects in X-ray powder diffraction
- 11.30
- Lunch
- 12.30
- Poster session B
- 14.00
- Seifert - FPM - exhibition, software presentation
- 15.00
- D. Louer, J.I. Langford:
Use of pattern decomposition to study microstructure.
Practical aspects and applications
- 15.45
- SHORT ORAL CONTRIBUTIONS :
B.K. Aleynikova, A.M. Belikov
X-Ray Powder Diffraction Control of Mechanical Properties of Metals and Alloy
R.I. Barabash
X-Ray Analysis of Ageing Ni-Based Superalloy
W.G. Marshall, R.J. Nelmes, J.S. Loveday, J.M. Besson, S. Klotz, G. Hammel
Preferred Orientation and Texture Effects in Neutron Powder Diffraction Data at High Pressure
C.M. Valot, F. Charlot, F. Bernard, M.T. Mesnier, N. Floquet, J.C. Niepce, J.F. Berar, M. Bessiere
X-Ray Diffraction In-Situ Analyses : Essential Way for Understanding Fine Grained Materials Propertie
J. Vacínová, J.L. Hodeau, D. Cox, M. Anne, P. Bordet, D. Richard, T. Berthoud, B. Bes, H. Dunlop, F. Le Gouic, J. Pannerier, A. Reeves, H. Graafsma, W. Schweggle, A. Kvick
High Energy Powder Diffraction by Using 2D Detectors : Application on Anomalous Scattering and Texture Investigation
- 19.30
- Dinner - local specialities
- 7.00
- Breakfast
- 8.00
- S. Enzo:
Size-strain analysis according to methods of profile fitting
- 8.45
- A. Le Bail:
Accounting for size-microstrain in whole powder pattern fitting
- 9.30
- Break
- 10.00
- M.J. Jarvinen:
Modelling of texture in whole pattern fitting
- 10.45
- D.K. Smith:
The role of whole-pattern data-bases in materials
characterization
- 11.30
- Lunch
- 12.30
- Poster session C
- 14.00
- SHORT ORAL CONTRIBUTIONS :
T. Blanton, M.A. Howey
The Effect of Gelatin on Silver Halide Strain in Photographic Film
W. Gille
Diameter Distribution of Spherical Primary Grains in the Boolean Model from Small-Angle Scattering
- 14.45
- R. Snyder, J. Fiala: Size-strain round robin
- 16.00
- Break
- 16.30
- Diffraction analysis of real structure of matter: plenary
discussion
- 18.00
- Closing ceremony
- 19.30
- Farewell party
Trip to the historical Spis Region and to the High Tatras (only for
persons interested)