SIZE - STRAIN'95 - ABSTRACTS
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Poster Session A
- PA01
- Honkimäki V., Suortti P.
Effects of Instrument Function, Crystallite Size and
Strain on Reflection Profiles.
- PA02
- Kalceff W., Armstrong N., Cline J.P.
A Maximum Entropy Approach to Deconvolution.
- PA03
- Kojdecki M.A.
Determination of Averaged Structure Characteristics
of Crystalline Powder or Polycrystal from X-Ray
Diffraction Line Profiles.
- PA04
- Paszkowicz W.
On the Concept of the "Dynamic Penalty Function "
Applied in the Smooth Genetic Algorithm of Solving
Powder Diffraction Patterns.
- PA05
- Rafaja D., Kuzel R.
Comparison of Several Powder Diffraction Geometries.
- PA06
- Dudek J., Kupriyanov M., Surowiak Z.
Application of X-Ray Powder Diffraction Methods for
the Ferroelectric Ceramics PZT-Type Studies.
- PA07
- Kushlyan G., Zakharov A., Kupriyanov M.
Variations of Ferroelectric PbTiO3 Structure
Parameters.
- PA08
- Kofanova N.B., Kuprianov M.F.
Application of X-Ray Powder Diffraction to Study of
Short-Range Ordering Effects.
- PA09
- Yagunov S., Abdulvakhidov K, Kupriyanov M.
Twinning and Block Structure of Real Ferroelectric
Crystals.
- PA10
- Sepelák V., Steinike U., Buchal A., Tkácová K.
Cation Distribution and Strain-Size Study of the
Mechanically Activated Zinc Ferrite.
- PA11
- Síchová H., Charvát J., Danis S.
X-Ray Structure Study of High-Tc Phase of
Bi(Pb)-Sr-Ca-Cu-O System.
- PA12
- Dobiásová L., Síchová H.
The Copper Bond Valence in CuO and Its High-Tc
Multicomponent Oxides.
- PA13
- Ivanov A.A., Fofanov A.D.
Rietveld Analysis of X-Ray Diffraction Data
Calculated on the Base of Mixed-Layer Crystal Model
for Yttrium Ceramics.
- PA14
- Zhigadlo N.D., Petrashko V.V., Prytkova N.A.,
Semenenko Yu.A., Tomilo Zh.M.
The Effect of Cs Additions on the Structure and
Superconducting Properties of the (Bi,Pb)2Sr2Ca2Cu3Oy
Superconductors.
- PA15
- Sidochin A., Gartstein E.
On the In-Plane Size and Strain Determination in ZBCo
on NdGaO3.
- PA16
- Olikhovskaya L., Rud' N.D., Ustinov A.I.
Investigation on {101} <101> Twin in the 123-Crystals
by X-Ray Method.
- PA17
- Lange G., Klimanek P.
X-Ray Analysis of Substructure - Property
Interrelations in Electrodeposited Cu-Coatings.
- PA18
- Sutta P., Jackuliak Q., Tvarozek V., Novotný I.,
Vojtkuláková Z.
Microstructural Properties of Palladium Thin Films
Obtained from X-Ray Diffraction and STM.
- PA19
- Pomes R., Quintana P., Maldonado L., Ramanauskas R.
Microstructure of Zinc and Zinc Alloy Electrodeposits
and Their Corrosion Resistance.
- PA20
- Ehrlich A., Prause S., Kelly P., Hoyer W.
Microstructure and Stress Characterization of PVD
Zirconium Nitride Thin Films. Cancelled
- PA21
- Keckés J., Ortner B., Cerven I., Jakabovic J.,
Kovác J.
Epitaxial Growth of Indium at Annealed ZnO/InP
Interfaces.
- PA22
- Betsofen S., Petrov L., Ronyak R.
The X-Ray Characterization of the Ion-Plated
Multilayer Coatings.
- PA23
- Gorski L.
X-Ray Studies of Phase Transitions in Composite Based
on Al2O3 due to Thermal Treatment Effects.