boundaries, etc.) cause diffuse scattering, which is located along certain sites rows in a reciprocal space. Besides, shape and position of reciprocal lattice sites appeared to be in these rows are sufficiently changed. It is clear that it is important to take into account a possibility of planar defects in an investigated structure in order to improve an accuracy of determination of strength and size of coherent scattering areas on the basis of profile and position analysis of diffraction maxima.
Within the frames of theories of X-Ray diffraction in a kinematic approximation, peculiarities of influences of planar defects on profiles and position of diffuse maxima are analyzed. On the example of FCC, HCP and BCT(R) lattices with planar defects of different types it is shown that the influence of such kinds of defects on diffuse profiles can be significantly anisotropic. In some cases it allows changing certain diffraction maxima, to exclude or significantly diminish the planar defects effect on determination of crystallite size and