Size-Strain IV Programme

15.30-18.00	Session 1	Chair: P. Scardi
15:45	Radomir Kuzel Faculty of Mathematics and Physics, Charles University, Prague, Czech Republic	Dislocation line broadening: a review
16:45		Coffee break
17:10	Ernesto Estevez Rams University of Havana, Cuba	Stacking Disorder and its Analysis by X-ray Diffraction
18:10	Nicholas Armstrong University of Technology, Sydney, Australia	Some considerations concerning Wilkens’ theory of dislocation line-broadening

9.00 - 12.15	Session 2	Chair: P. Klimanek
9.00	Nicholas Armstrong University of Technology, Sydney, Australia	Status of NIST Nanocrystallite Size SRM 1979
9:30	Paolo Scardi University of Trento, Italy	Whole Powder Pattern Modelling for the study of nanocrystalline and imperfect materials
10.30		Coffee break
11.00	David Rafaja Freiberg University of Mining and Technology Freiberg, Germany	Coherence of nanocrystalline particles to X-rays
11.30	Roman Pielaszek High Pressure Research Center, Polish Academy of Sciences, Warszawa, Poland	Analytical expression for Diffraction Line Profile for polydispersive powders. New methods for Grain Size Distribution determination
12.00	Zbigniew Kaszkur Institute of Physical Chemistry PAS, Warszawa, Poland	Test of applicability of some powder diffraction tools to nanocrystals

14.00 - 19.00	Session 3	Chair: D. Rafaja
14.00	Jenö Gubicza Eötvös Lorand University, Budapest, Hungary	Microstructure of severely deformed metals from X-ray peak profile analysis
14:30	Andreas Leineweber Max Planck Institute for Metals Research, Stuttgart, Germany	Composition variations in line broadening analysis
15.00	Juan Rodriguez Carvajal Laboratoire Leon Brillouin (CEA-CNRS), Gif sur Yvette, France	Simplified Microstructural Models to Analyze Anisotropic Size and Strain
15.30		Coffee break
16:00	András Borbély Eötvös Lorand University, Budapest, Hungary	Evaluation of size and strain parameters from X-ray peaks by the momentum method
16:30	Alexandre Boulle National Center for Scientific Research (CNRS) Limoges, France	X-ray diffraction from epitaxial thin films : an analytical expression of the line profiles accounting for microstructure
17.00	Round Table and Conclusions

		L. Cranswick
8.00		Free buffet breakfast snacks (tea/coffee/pastries/sandwiches)
8.50	Lachlan Cranswick	Introduction
9:00	Arnold C. Vermeulen Panalytical, Almelo, The Netherlands	New user-friendly possibilities for size-strain analysis with X'Pert HighScore Plus
9.20	Gábor Rinárik, Tamás Ungár Eötvös Lorand University, Budapest, Hungary	CMWP-fit for size/strain analysis: size-distribution, dislocation structures and stacking faults
9.40	Paolo Scardi, Matteo Leoni Engineering Faculty, University of Trento, Trento, Italy	PM2000 - a Whole Powder Pattern Modelling approach to structure/microstructure refinement
10.00	Juan Rodriguez Carvajal Laboratoire Leon Brillouin (CEA-CNRS), Gif sur Yvette, France	Size/Strain analysis of complex materials using Fullprof
10.20		Coffee break
11.00	Jörg Bergmann, Reinhard Kleeberg Technical University Freiberg, Institute of Mineralogy, Freiberg, Germany	Size/Strain analysis using the BGMN Fundamental Parameters Rietveld software
11.20	Luca Lutterotti Engineering Faculty, University of Trento, Trento, Italy	Size/Strain analysis using the MAUD for Java Rietveld software
11.40	Dennis D. Eberl U.S. Geological Survey Central Region Research, U.S. Geological Survey, Boulder, Colorado, USA	MudMaster: A program for crystallite size and strain analysis of clays using the Bertaut-Warren-Averbach method
12.00	Arnt Kern Bruker AXS, Karlsruhe, Germany	Size-Strain analysis by convolution based profile fitting using Topas