Prof. RNDr. Vaclav Valvoda, CSc.

Vedouci katedry fyziky elektronovych struktur

Mistnost: 1008, prizemi, Ke Karlovu 5
Telefon: (02) 2191 1387
Fax: (02) 2491 1061
E-mail: valvoda@karlov.mff.cuni.cz

Curriculum Vitae

Narozen 18. 9. 1937

Vzdelani a vedecko-pedagogicke tituly

Absolvent Matematicko fyzikální fakulty Univerzity Karlovy v Praze (1961). RNDr - 1967, CSc. - 1968, docent - 1990, profesor - 1992, vse na teze fakulte.

Zamestnani

1961 pedagogicky pracovnik na vyse uvedenem pracovisti.
1985 vedouci oddeleni strukturni analyzy.
1991-93 prodekan pro vedecke zalezitosti.
1995 vedouci katedry fyziky polovodicu (od roku 1999 katedra fyziky elektronovych struktur).

Ceny

Cena CSAV za vyzkum struktury tenkych vrstev - 1991,
Cena a medaile I. stupne ministra skolstvi CR za ucebnici "Zaklady strukturni analyzy", Karolinum, Praha 1992.

Clenstvi ve spolecnostech a funkce

Clen Krystalograficke spolecnosti (v letech 1985-1990 vedecky tajemnik),
clen Akreditacni komise MSMT (fyzikalni sekce),
predseda komise MFF UK pro obhajoby doktorskych disertacnich praci,
clen International Centre for Diffraction Data (USA)
clen vyboru International X-ray Analysis Society (USA).

Zahranicni pobyty

Indian Institute of Science, Bangalore, Indie (1969 - 6 mesicu)
Twente University in Enschede, Holandsko (1979 - 6 mesicu)
Max-Planck-Institute, Stuttgart (1991 - 2 mesice)

Zamereni vedecke cinnosti

Studium teplotnich kmitu atomu v kovech, slitinach, tuhych roztocich a slouceninach metodami rtg a neutronové difrakce. Rtg analyza deformace elektronovych hustot vazanych atomu v pevnych latkach, specialne v materialech praskove metalurgie. Metodicke prace zamerene na korekce vlivu prednostniho usporadani krystalitu v praskovych vzorcích. Strukturní analyza tenkych vrstev, iontove implantovanych povrchu a kovovych magnetickych multivrstev.

Vedecke publikace

Autor 4 skript a spoluautor 5 ucebnic.
Autor nebo spoluautor vice nez 200 puvodnich vedeckych praci otistenych v mezinarodnich casopisech a sbornicich.
Vice nez 300 zaznamu citaci v Science Citation Index.

Prednaskova a organizacni cinnost

Pozvane prednasky na 26 zahranicnich konferencich.
Prednaskove pobyty na 11 evropskych univerzitach.
Predseda programoveho vyboru konference Advanced Methods in X-ray and Neutron Structure Analysis of Materials (Karlovy Vary - 1987, Praha - 1991),
spoluorganizátor symposia Protective Coatings and Thin Films in the E-MRS Spring Meeting 1999 in Strasbourg.

Vybrané publikace

V. Valvoda, R. Kuzel Jr. and J. Musil: Structure of TiN Coatings Deposited at relatively High Rates and Low Temperatures by MagnetronSputtering, Thin Solid Films, 156(1988)53.
V. Valvoda, R. Cerny, R. Kuzel Jr., J. Musil and V. Poulek: Dependence of Microstructure of TiN Coatings on their Thickness, Thin Solid Films, 158(1988)225.
V. Valvoda, R. Cerny, R. Kuzel Jr., L. Dobiásová, J. Musil, V. Poulek and J. Vyskocil: X-ray Analysis of Heat-Treated Titanium Nitride Films, Thin Solid Films, 170(1989)201.
V. Valvoda, R. Kuzel Jr., R. Cerny, D. Rafaja, J. Musil, S. Kadlec and A.J. Perry: Microstructure of TiN Thin Films Studied by Seemann-Bohlin X-ray Diffractometry, Thin Solid Films,193-4 (1990)401.
V. Valvoda, A.J. Perry, L. Hultman, J. Musil and S. Kadlec: On Picostructural Models of Physically Vapor-Deposited Films of Titanium Nitride, Surface and Coatings Technology, 49(1991)181.
V. Valvoda: Glory and Misery of the Structure Analysis of Thin Polycrystalline Films, Mater.Sci.Forum, 79-82(1991)503.
A.J. Perry, V. Valvoda and D. Rafaja: Residual Stress Measurement in TiN, ZrN and HfN Films Using the Seemann-Bohlin Method, Thin Solid Films, 214(1992)169.
R. Kuzel Jr., R. Cerny, V. Valvoda, M. Blomberg and M. Merisalo: Complex XRD Microstructural Studies of Hard Coatings Applied to PVD-deposited TiN Films, Thin Solid Films, 247(1994)64.
M. Chládek, C. Dorner, A. Buchal, V. Valvoda, H. Hoffmann: Quantitative in-situ x-ray diffraction analysis of magnetic multilayers during annealing J.Appl.Phys., 80(3)(1996)1437-1445.
M. Chládek, V. Valvoda, C. Dorner, V. Holy, J. Grim: Quantitative study of interface roughness replication in multilayers using x-ray reflectivity and transmission electron microscopy Appl.Phys.Lett., 69(9)(1996)1318-1320.
V. Valvoda, M. Chládek, R. Cerny: Joint texture refinement J.Appl.Cryst., 29 (1996) 48-52.
M. Chládek, C. Dorner, M. Matner, H. Hoffmann, V. Valvoda: Structural and magnetic properties of Ni81Fe19/Ag multilayers with ultrathin Ni81Fe19 sublayres J.Phys. C 9 (1997) 4557-4574.
M. Chládek, V. Valvoda, C. Dorner, W. Ernst: Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques - I, Interlayer structure Journal of Magnetism and Magnetic Materials 172 (1997) 209-217.
V. Valvoda: Characterisation of TiN coatings by XRD, in: Y. Pauleau, P. Barna (eds.), Protective Coatings and Thin films, Kluwer Academic Press,, Dordrecht 1997, pp. 299-305. ISBN 0-7923-4380-8.

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