MS details

The schedule is available at https://www.conftool.com/iucr2020/

Combination of X-rays and electrons for structure characterization

Comments

If a single crystal of adequate size and quality is available, single-crystal X-ray diffraction is the method of choice for structure analysis. However, if such crystals are not available, powder X-ray diffraction and electron crystallography provide a viable alternative. Structure analysis from X-ray powder diffraction data are hampered by reflection overlap, but the diffraction process is kinematic, so the reflection intensities are easily interpreted. Electron diffraction data do not suffer from reflection overlap, but the diffraction process is dynamical, and this makes the intensities more difficult to interpret directly. By combining these two techniques, the structures of materials that are difficult to elucidate with either technique alone become accessible.

Chair persons

Name

Family

Institution

City

Country

Region

Lynne

McCusker

ETH Zürich

Zurich

Switzerland

ECA

Junliang

Sun

Beijing University

Beijing

China

AsCA

 

Invited speakers

Name

Family

Institution

City

Country

Title

Stef

Smeets

Technical University Delft

Delft

Netherlands

Tatiana

Gorelik

Ulm University

Ulm University

Germany