MS details

The schedule is available at https://www.conftool.com/iucr2020/

Combining X-ray diffraction and spectroscopy to characterise materials

Comments

Structural and electronic information obtainable from XAS analysis are widely complementary with those from XRPD. XAS provides details about the electronic state, local coordination chemistry and atomic structure around the absorber in the few Å scale, while XRPD describes the crystallographic structure of long range coherent phases. These techniques can be combined to achieve reliable understanding of the physico-chemical properties of complex systems such as natural bio-geo-chemical compounds and novel materials. This symposium could be shared also with the commission on Powder diffraction

Chair persons

Name

Family

Institution

City

Country

Region

Carlo

Meneghini

University of Roma 3

Rome

Italy

ECA

Siegbert

Schmid

University of Sydney

Sydney

Australia

AsCA

 

Invited speakers

Name

Family

Institution

City

Country

Title