Software for X-ray powder diffraction pattern analysis
Motto:
From powder diffractionists to
powder diffraction community.
Recently available products:
ZDS System version 6.x for DOS
ZDS System version 1.0 for Window '95
Integrated
system for powder XRD step-scanned data analysis and management profiting
from file managing features and multitasking capabilities of Windows95 operating
system. Simple file operations
(copying, moving, deleting ...),
launching of procedures from a toolbar or using icons just on one or several mouse clicks
and/or drag-and-drops. Possibility
to group individual files of particular interest in one catalogue described by user selected name. Instant
preview of patterns before their loading saves time and prevents loading
of unwanted patterns. Search/Match procedure cooperating with PDF2 database by ICDD-JCPDS
allows to identify up to 10 phases in powder pattern and supports
very easy work with sheets in MS Access format.The system is
designed to be operated on recent PC compatible machines with
quite good performance and W95. Other features like
profile-fitting, unit-cell parameters refinement, Boolean search
in PDF2 database, whole powder pattern fitting and more will be
available early.