The Microstructure of Crystalline Materials Determined by X-ray Diffraction Peak Profile Analysis

T. Ungár

Department of General Physics, Eötvös University Budapest,

H-1518, POB 32, Budapest Hungary

Abstract

X-ray diffraction peak profile analysis can provide crystallite size and size distribution, dislocation densities and dipole character, Burgers vector type and population, stacking- and twin faults and internal stresses. For a comprehensive microstructure characterization these features are matched with transmission electron microscopy. The case studies of a ball-milled Al-Mg alloy, an Al -Mg-Sc-Zr alloy deformed by high-pressure torsion, pure electrodeposited Ni deformed by different methods and commercial purity Ti deformed by equal channel angular pressing are discussed. The relative fractions of the three fundamental slip systems, basal, pyramidal and prismatic, in Ti are determined as a function of annealing temperatures. The thermal stability of the Ti and Al-Mg-Sc-Zr specimens reveal that heat release in the scanning calorimeter corresponds to recrystallization well after recovery.