Tentative Program

up to 13:30 arrival, lunch, accomodating

Wednesday 1. 10.

15:00 Metin Tolan (tutorial): X-ray reflectometry

15.45 - 16.00 BREAK
  • 16:00 Samolienko: On the statistical interpretation of x-ray reflectivity data fitting
  • 16:20 Bolm: X-ray reflectivity and GID from organic multilayers
  • 16:40 Fulthorpe: X-ray reflectivity studies of sputtered Cu/Co multilayers on etched silicon
  • 17:00 Stangl: X-ray reflectivity from Si/Si/Ge/SiC superlattices
17:20 - 17.40 BREAK
  • 17:40 Safronov: LB films of three-component random copolymers with chromophore groups and study by X-ray diffraction
  • 18:00 Nefedov: High resolution X-ray scattering of thin Pt films on Sapphire
  • 18:20 Eisenschmidt: Reflectometry at Bi/Ti layers
19:00 Dinner
20:00 GET-TOGETHER PARTY

Thursday 2. 10.

7:45 BREAKFAST

8:30 Ullrich Pietsch (tutorial): High-resolution X-ray diffraction

9.15 - 9.30 BREAK
  • 9:30 Thiele: Reciprocal space mapping of Si/Ge multiquantum wells
  • 9:50 Zeimer: High-resolution XRD from buried SQW
  • 10:10 Schaefer: Determination of the deformation tensor of ZnSe epilayers pseudomorphically grown on misoriented GaAs substrate
  • 10:30 Dynowska: Strain relaxation of CdTe/CdMnTe and CdTe/MnTe superlattices grown by MBE on GaAs (100)
11.10 - 11.30 BREAK
  • 11:30 Sourek: High resolution X-ray diffraction by III-V semiconductor layers
  • 11:50 Korn: Characterization of ZnSTe/ZnTe superlattices
  • 12:10 Gerhard: Comparison of superlattices based on ZnSTe and BeTe
  • 12:30 Haratuyunyan : X-ray diffraction investigation of the relaxation state in strained GaInAs/GaAs multilayer structures
13:00 LUNCH

15:30 Juergern Haertwig (tutorial): X-ray topography

16.15 - 16.30 BREAK
  • 16:30 Ludwig: X-ray topographc analysis of dislocations in thin SIMOX layers
  • 16:50 Markov: Surface demages revealing in chemical-mechanical polished silicon wafers by X-ray grazing incidence topography and TEM
  • 17:10 Kinne: Image platess as detectors in high-resolution X-ray diffraction
17:30 - 17:50 BREAK
  • 17:50 Ress: Utilization of image plates for high resolution X-ray diffraction
  • 18:10 Eichhorn: X-ray characterization of Si implanted with MeV Ge ions
  • 18:30 Poloucek: X-ray reflectivity from DNA monolayers
19:00 DINNER
  • 20:00 Leszcinsky :Microstructure of GaN surface, epilayers and bulk crystals
  • 20:20 Mazur: X-ray high resolution diffraction study of the mechanical treatment related defects
  • 20:40 Nesterents: X-ray diffraction from superlattices with microdefects and layer thickness fluctuations
21:00 WINE PARTY

Friday 3. 10.

7:45 BREAKFAST

8:30 Tim Salditt (tutorial): X-ray diffuse scattering

9:15 - 9:30 BREAK
  • 9:30 Neumann: X-ray magnetic circulr dichrosim studies from modulated specular reflectivity
  • 9:50 Beck: Structural characterization of duried delta layers in Si(100) by non-specular reflectivity and reciprocal space mapping
  • 10:10 Grim: Diffuse reflectivity of strain compensated Si/SiGe multilayers
  • 10:30 Valvoda: Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques
10:50 - 11:10 BREAK
  • 11:10 Veldkamp: Two dimensional scanning diffractometry for gradient optics investigation
  • 11:30 Löhmann: Structure of sputtered molybdenum in single layers and multilayers with silicon
  • 11:50 Grenzer: High-resolution XRD and X-ray diffuse scattering from semiconductor multilayers
  • 12:10 Bak-Misiuk: Influence of hydrostatic pressure on transformation AlGaAs/GaAs interface
  • 12.30 Domalga: Methodology of lattice parameter measurements for bent crystals
13:00 LUNCH

15:30 Sergey Stepanov (tutorial): X-ray grazing incidence diffraction

16:15 - 16:30 BREAK
  • 16:30 Ulyanenkov: Grazing incidence x-ray diffraction from multilayers in view of diffuse scattering from rough interfaces
  • 16:50 Sauer: Ti diffusion in LiNbO3 characterized by useing X-ray grazing incidence diffraction
  • 17:10 Kovats: Huang scattering under grazing incidence from pseudomorphic SiC layers on Si
  • 17:50 Kondrashkina: High-resolution diffraction and grazing incidence X-ray scattering from InGaP/GaAs multilayers
  • 18:10 Fanchenko: Some aspects of grazing-incidence diffraction from crystals inhomogeneous films
  • 18:30 Clarke: Asymmetries in grazing incidence diffuse X-ray scattering
  • 18:50 Schroer: Three beam interferences on layered systems
20:00 TOWER PARTY

Saturday 4. 10.

7:45 BREAKFAST

8:30 Tilo Baumbach (tutorial): X-ray diffraction from structurized surfaces

9:15 - 9:30 BREAK
  • 9:30 Mikulik: X-ray reflectivity from multilayer gratings
  • 9:50 Zuang: Diffraction and reflectivity studies on Si/SiGe reactive ion etched periodic wire and dot structures
  • 10:10 Darhuber: X-ray diffraction and reflection from self assembeled quantum dots
  • 10:30 Lübbert: Determination of relaxation effects in semiconductor heterostructures by X-ray grazing incidence diffraction
10:50 - 11:10 BREAK
  • 11:10 Ponti: Strain investigation in semiconductor epitaxial lateral structures
  • 11:30 Darowski: X-ray grazing incidence diffraction from buried quantum wires
  • 11:50 Wiebach: Strain in Si(1-x)Gex islands on silicon investigated by x-ray diffraction
  • 12:10 Kharchenko: Influence of secondary extinction on X-ray diffraction from nonuniform crystals with microdefects
  • 12:30 Sozonov: Photoemmission excited by the interference X-ray wave field for structural characterization of surface layers and thin films
13:00 LUNCH

END OF THE MEETING