MHz Microscopy at European XFEL
P. Vagovič1, 2, Pablo Villanueva Perez3, T. Sato2, V. Bellucci2, S. Birsteinova2, H. J. Kirkwood2, G. Giovanetti2, M. Stupar2, N. Jardon2, J. Szuba2, K. Wrona2, R. Bean2, R. Letrun2, J. Koliyadu2, R. Graceffa2, Antonio Bonucci2, L. Adriano2, M.C. Zdora4, J. Uličný5, P. F. Garcia-Moreno6,7, S. Hall3, C.D. Ohl8, W. Yashiro9, A. Korsunsky10, H. Soyama11,, A. P. Mancuso2,12, A. Meents1 , H. Chapman1
1Center for Free-Electron Laser Science (CFEL), DESY, Hamburg, Germany, 2European XFEL GmbH, Hamburg, Germany, 3 Lund University, Sweden, 4Paul Scherrer Institute, 5232 Villigen PSI, Switzerland, 5 Faculty of Science, Department of Biophysics, P. J. Šafárik University,Slovakia, 6Department of Chemistry and Physics, Institute of Applied Materials, Helmholtz Centre Berlin, Hahn-Meitner-Platz 1, Berlin 14109, Germany, 7Institute of Materials Science and Technologies, Technical University Berlin, Hardenbergstr. 60, Berlin 10623, Germany, 8Faculty of Natural Sciences, Institute for Physics, Otto-von-Guericke-University Magdeburg, Universitätsplatz 2, 39016 Magdeburg, Germany,9International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University, 10Department of Engineering Science, University of Oxford, Parks Road, Oxford, Oxfordshire, OX1 3PJ, United Kingdom, 11Finemechanics Department, Tohoku University, 6-6-01 Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan, 12La Trobe Institute for Molecular Science, La Trobe University, Melbourne, Victoria 3086, Australia,
*patrik.vagovic@cfel.de
First MHz rate fourth generation hard X-ray XFEL source European XFEL [1] provide unique opportunity for characterisation of stochastic dynamics occurring in various systems either naturally or response is stimulated by an external force. High repetition rate of pulses (up to 4.5 MHz) together with high flux per pulse allow to record projected X-ray radiograms of dynamic samples and image more then million frames per second with high spatio-temporal resolution. Each such frame is illuminated using ultrashort exposure (fs scale) given by the X-ray pulse duration providing “frozen in time” snapshots of stochastic phenomena. This enable to film fast stochastic processes individual realisations in slow smooth motion. Experimental configuration of projection X-ray radiography is shown on Fig.1. Moreover, EuXFEL SASE1 undulator generate X-ray pulses with three orders higher number of photons per pulse (1012 photons) as compared to synchrotrons reaching hard X-ray range up to 24keV with ~20eV bandwidth. This unique performance allows for implementation of X-ray beam splitting schemes of multiprotection microscopy to obtain 3D snapshots per single pulse of dynamic objects sampled at MHz rate. We will present applications of recently developed MHz XFEL projection X-ray microscopy [2] applied for study of industrially relevant fluidic system behaving stochastically and we will present experimental results from recent characterisation of multi-projection MHz X-ray which is being developed under EIC-Pathfinder MHz-Tomoscopy project at SPB/SFX instrument [3].
Fig. 1 Experimental arrangement of MHz X-ray projection Microscopy at European XFEL SPB/SFX instrument.