Many applications in the field of X-ray
analytics require an X-ray beam with high flux density at the sample position.
Examples for these applications are single crystal diffraction, small angle
scattering or microdiffraction to name but a few. The ideal source for diffractometry
combines a device, that produces a microfocus X-ray beam of a size of below 50
µm, with a perfectly shaped high-reflectivity X-ray optics like multilayer
mirrors, that are able to focus or collimate the beam to the sample or detector
position.
In this contribution we will be presenting the latest developments of this
kind of solution. Our family of air-cooled Incoatec Microfocus Sources deliver
collimated beams with a divergence of below 0.5 mrad or focused beams with
sizes down to about 100 µm with a flux of up to 5x10^8 ph/s. Most of these
sources are integrated in standard instruments. More and more they are also
successfully integrated in customized set ups for in-situ measurements of
crystal and thin film growth.
We will be showing some examples in the field of X-ray diffractometry and SAXS, that were not long ago only possible with synchrotron or rotating anode sources.