Experimental factors such as crystal characteristics, available experiment time and the properties of the X-ray sources and detectors have a strong impact on data quality and can make the difference between success and failure in phasing attempts or result in a more or less accurate atomic model. The talk focuses on the XRD equipment and is intended as an overview on recent developments of X-ray diffraction systems and the fields where STOE XRD instruments are most beneficial.
A variety of measurement setups with respect to goniometers, diffraction geometries, detectors, X-ray sources and sample environments will be presented, and both Powder XRD and Single Crystal XRD applications will be exemplified. Additionally, recent advances in detector technology, novel in situ camera and implementation of MetalJet X-ray source will be highlighted and the tangible benefits for the scientists will be made transparent, e.g. gaining measurement speed, improving data quality and acceptance of samples with complex crystallinity.