The region with
approximate composition Cu3+xSi of the phase diagram of Cu-Si undergoes two
phase transitions with increasing temperature: η” at room temperature,
η’ and η at high temperature [1]. Even though the phase diagram is
well established, recent studies have revealed new aspects from both the phase
transitions and the crystal structures [2,3]. In this work we prepared samples by
arc-melting with nominal composition Cu77Si23, Cu76Si24
and Cu75Si25. Samples were annealed at 650 °C during 24 h for homogenization. Temperature-dependent
powder X-ray diffraction (TD-PXRD), temperature-dependent single crystal X-ray diffraction
(TD-SCRXD), and DSC between 30 °C and 700 °C were combined for elucidating the
crystal structures of the Cu3+xSi phases. Six phases were observed with
increasing temperature: η’’’, η’’, η’, η3, η2 and
η1. Five of the observed phases are incommensurately modulated. Sample
Cu76Si24 was used during the temperature-dependent SCXRD. The average structure
at room temperature has unit cell parameters a = 4.0700(3) Å, c = 14.6848(7)
Å, it is similar for the three compositions studied and for η’’’ and
η’’. Although the point group of the complete diffraction pattern is , the average structure can be described in the space group
. The average structure can be described by three repetitions
of hexagonal and honeycomb shaped layers (Fig. 1a). The modulation is revealed
by large anisotropic distribution of electron density around the Cu atoms of
the layer B. Two modulation vectors are necessary to index the complete
diffraction pattern (Fig. 1b): q1=
and q2=
, where
(point group
) for η’’, and
,
(point group
) for η’’’. Both structures could be solved in (3+2)D
superspace by Superflip [4], superspace groups
and
for η’’ and η’’’, respectively. The modulation
function of both structures have amplitudes comparable to the size of the unit
cell, discontinuities and windows. Given the complexity of the modulation and
the small number of reflections measured, the function could not be
parametrized to be refined using the superspace formalism, and a supercell
approximation had to be used. Since
for η’’, a 4x4x3 supercell could be used, while the
smallest possible approximation for η’’’ was a 14x14x3 supercell. The
refinement was performed in Jana2006 [5].
Temperature-dependent powder X-ray diffraction of the samples Cu74Si26 and Cu78Si22 was measured every 30 °, from 30 °C to 700 °C with heating rate of 5 °C/min. Two cycles of heating and cooling were measured to verify the reversibility of the transitions. Three additional phases, which were not present in the phase diagram, were observed, the transitions were reversible and reproducible with small hysteresis in the transition temperatures. Le Bail fitting of the powder patters was performed in Jana2006 using the models obtained by SCXRD, pseudo-Voigt profile, manual background combined with fifteen terms of Legendre polynomials. Initially the main reflections were indexed using cyclic refinement, and the modulation vectors were refined separately for each temperature, after the cyclic refinement. Except for the phase η3, powder patterns of the sample Cu78Si22 presented the same transitions as for the sample Cu74Si26 and only this sample will be shown. From the six phases observed in the sample Cu74Si26, five were completely indexed. Our study shows that the phase diagram might be more complex than that reported in the literature.