A synchrotron tool used to process home source data

J. Stransky1,2, J. Dohnalek1

1Institute of Biotechnology, CAS, Biocev, Prumyslova 595, 25250  Vestec

2Department of Solid State Engineering, Faculty of Nuclear Sciences and Physical Enginering, CTU, Trojanova 13, Praha

stransky@ibt.cas.cz

Laboratory instruments for X-ray diffraction measurements are becoming more powerful with new technologies such as the liquid anode sources or HPAD detectors. It allows efficient diffraction experiments, including data for native SAD phasing, on an increasing number of protein samples in house, without the need of a synchrotron source. The crucial part of the diffraction measurement is data processing. It is a very much standardized process for synchrotron data and users are used to processing data with tools such as XDS [1]. However, in house data collection has a few specific parameters compared to synchrotron: the measurement consists of several runs with various geometry settings and the geometries are non-orthogonal. Even though XDS can process such individual runs, settings are non-trivial and behind the scope of a general user. Therefore, Xdskappa was introduced to simplify processing of in house data using XDS. Xdskappa automatically generates input for XDS and runs XDS on multiple datasets simultaneously. Moreover, a possibility of manual fine tuning remains. Xdskappa is distributed under the GNU General Public License 3 [2].

1. W. Kabsch, Acta Cryst. D, 60(2), (2010), 125-132.

2. GNU General Public License, Free Software Foundation, https://www.gnu.org/licenses/gpl-3.0.en.html.

This work was supported by project BIOCEV (CZ.1.05/1.1.00/02.0109) from the ERDF, by the ERDF fund (CZ.02.1.01/0.0/0.0/16_013/0001776), by MEYS CR (LM2015043 CIISB and LQ1604 NPU II), and by the Grant Agency of the Czech Technical University in Prague, grant No. SGS16/246/OHK4/3T/14.