HIGH ENERGY X-RAY DIFFRACTION

V. Honkimäki

ESRF, Grenoble, France

The use of high-energy radiation has increased during the last years with the first high-energy sources on third generation synchrotrons. The high flux and well-collimated beam together with the high penetration depth enable the study of thick samples but nevertheless small gauge volumes. Furthermore, the high-energy diffraction is on forward direction and therefore, the use of flat 2D-detectors is possible. This has opened new possibilities for many applications including the studies of liquids and amorphous materials, powder diffraction, single crystal studies, diffuse scattering and studies of buried interfaces. Some examples of the use of these properties for studying bulky and heavy samples are given, like, the stress-strain analysis and studies of buried interfaces.