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Research
Experience Mainly in the field of X-ray diffraction - study of thermal vibrations (Debye-Waller
factors), study of strain and lattice defects by XRD line profile
analysis, microstructural complex XRD characterisation of thin films
(detailed study of the relations between deposition conditions and
microstructural parameters, laboratory work, computer programming.
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Main goals - derivation of general method for dislocation content
estimation from X-ray diffraction line broadening, study of
microstructural inhomogeneities in nitride hard coatings, generalisation
of analytical method for fitting of microstructutral parameters from
measured XRD line profile, evaluation of anomalous diffraction profiles
in Cu-Alloys with precipitates, study of microstructure evolution in
submicrocrystalline samples prepared by severe plastic deformation |