SCANMAT, Warsaw, Poland
X-ray diffraction (XRD) remains one of the key methods used in the analysis of crystal structure and phase identification of solid materials. With the development of instrumentation technology, XRD systems are becoming increasingly efficient, compact, and adapted to a variety of applications, from basic research to industrial quality control. The presentation will introduce selected XRD solutions and other techniques offered by Scanmat in cooperation with LANScientific.