Heusler compounds constitute a broad family of intermetallic materials, with more than 1500 possible compositions reported to date. Among them, the Rh–Mn–Sb system has attracted scientific interest for nearly half a century1. However, although bulk Rh–Mn–Sb alloys were studied several decades ago, experimental work on this system has since remained very limited, and thin films have not been explored. In this context, Rh₂MnSb full-Heusler thin films were epitaxially grown for the first time on MgO(001) substrates by DC magnetron sputtering at deposition temperatures of 600, 700, and 800 °C2. Films with a nominal thickness of 200 nm were systematically characterized in terms of their structural, morphological, optical, magneto-optical, and magnetic properties. The sample deposited at 600 °C was close to stoichiometric and exhibited an almost perfectly ordered L2₁ structure. All films exhibited a tetragonal structure and a regular twinned microstructure, in which most twin domains were oriented with the c-axis perpendicular to the film surface, presumably as a result of the constraint imposed by the substrate. Magnetic measurements for the film grown at 600 °C yielded a Curie temperature of about 220–275 K and a saturation magnetization of approximately 55 emu/g at 10 K, both close to bulk values, while magneto-optical Kerr measurements indicated paramagnetic behavior at room temperature. These results demonstrate the potential of Rh₂MnSb thin films and motivate further work aimed at improving compositional precision and structural control.
