Enabling Nanoscale Insight: Advanced X-ray Scattering Solutions from Xenocs

Szymon Stolarek

Xenocs SAS, 1-3 Allée du Nanomètre 38000 Grenoble France

Understanding structure at the nanoscale is critical to innovation across fields ranging from biotechnology to materials science. Founded with the mission to make advanced characterization tools accessible to researchers worldwide, Xenocs develops state-of-the-art laboratory solutions based on small- and wide-angle X-ray scattering (SAXS/WAXS) and X-ray imaging, enabling high-quality, multiscale structural analysis for both research and industrial applications.

This presentation will introduce two of Xenocs' flagship solutions: the Xeuss Pro and the Nano-inXider. Designed for maximum versatility, the Xeuss Pro is a modular SAXS/WAXS/GISAXS/USAXS/Imaging platform offering synchrotron-grade performance in the laboratory. It supports a range of X-ray sources—including microfocus sources with various target materials, MetalJet, and rotating anode (RAG) options—as well as a focused AuX source for small-spot or high-resolution applications. With integrated USAXS and motorized SWAXS it enables fully automated and continuous measurements from atomic to micron scales. In addition, the InXight X-ray imaging module with dark-field and phase-contrast option further extends capabilities by revealing orientation, heterogeneity, and interfaces in complex materials. All these capabilities are seamlessly managed through the Xenocs Xplore control software, which provides an ergonomic interface for experiment planning, scriptable control (e.g. Python), and real-time equipment monitoring to track system performance remotely.

The Nano-inXider, by contrast, offers a compact, easy-to-use SAXS/WAXS system for routine nanostructural analysis. It combines a small footprint and intuitive operation with high-quality, reproducible data—making it ideally suited for quality control, process monitoring, and material development in both academic and industrial laboratories.

To complement these instruments, Xenocs provides XSACT Pro, an all-in-one SAXS/WAXS data analysis platform. It supports a wide range of analytical workflows including two advanced modules: one for AI-assisted shape classification and another for automated model fitting, helping researchers extract structural insights from complex scattering patterns quickly and reliably.

Trusted by leading academic institutions and companies across diverse sectors, Xenocs instruments accelerate material development and process optimization. Through high-performance, scalable, and user-focused solutions, Xenocs advances its mission: enabling nanoscale insight through continuous innovation.

Fig. 1. Xeuss Pro horizontal platform for SAXS/WAXS/GISAXS/USAXS and imaging alongside the Nano-inXider compact vertical system.