C.R. Houska and R. Kužel: Warren-Averbach method, in Defect and Microstructure Analysis by Diffraction, eds. R.L. Snyder, J. Fiala, H
.J. Bunge, Oxford University Press, October 1999.C.R. Houska and R. Kužel: Analytic functions describing line profiles influenced by size distribution, strain and stacking faults, in Defect and Microstructure Analysis by Diffraction, eds. R.L. Snyder, J.
Fiala, H.J. Bunge, Oxford University Press, October 1999.V. Valvoda: Texture effects in powder diffraction and their correction by simple empirical functions, in Defect and Microstructure Analysis by Diffraction, eds. R.L. Snyder, J. Fiala, H.J. Bunge, Oxford University Press, October 1999.
D. Rafaja, R. Kužel and V. Valvoda: Glancing Angle XRD Measurement on Metallurgical Coatings, Acta Cryst. A55 (1999) 74; supplement, abstract M07.DD.002.
D. Rafaja, R. Kužel, V. Valvoda and G. Cappuccio: Instrumental Effects upon the Glancing Angle XRD Measurements, Acta Cryst. A55 (1999) 228; supplement, abstract P12.01.002.
R. Kužel: Anisotropy of Diffraction Line Profile Parameters and Real Structure of Materials, Acta Cryst. A55 (1999) 228; supplement, abstract P05.EE.002.
R. Kužel, P. Klimanek: Analysis of Diffraction-Line Broadening, the State of Art, Abstract, Materials Structure, vol. 6, 1999, p. 52
R. Kužel: Výklad kinematické teorie rozptylu rtg záření reálnými krystaly (Kinematic theory of X-ray Scattering by Real Crystals - possible approach of teaching), Abstract, Materials Structure, vol. 6, 1999, p. 59
D. Rafaja, J. Kub: Artificial Modulations in Laterally Periodic Structures, Abstract, Materials Structure, vol. 6, 1999, p. 56
V. Valvoda: X-ray techniques for the characterization of thin films and layered structures, Third Workshop on Thin Films Physics & Technology, Trieste, March 8 – 26, 1999.
V. Valvoda: X-ray techniques for characterization of metallic multilayers, Frascati, October 15, 1999.
R. Kužel: Structural investigations of sub-microcrystalline Copper, Nickel, Germanium and Silicon, Regional Powder Diffraction Conference, RPDK'99, Liptovský Mikuláš, September 1999.
R. Kužel, P.
Klimanek: Analysis of Diffraction-Line Broadening, the State of Art, Struktura'99, Colloquium of the Czech and Slovak Crystallographic Association, Hodonín u Kunštátu, June 1999. in CzechR. Kužel: Výuka krystalografie a strukturní analýzy v ČR a SR (Teach
ing of Crystallography and Structure Analysis in the Czech Republic and Slovakia)D. Rafaja, J. Kub: Artificial Modulations in Laterally Periodic
Structures
Struktura'99, Colloquium of the Czech and Slovak Crystallographic Association, Hodonín u
Kunštátu, June 1999. in Czech
All persons of our X-ray laboratory are members of the Czech and Slovak Crystallographic Association (CSCA). R. Kužel is a secretary of the CSCA and the head of the Regional Committee of the International Union of Crystallography. R. Kužel and D. Rafaja are members of the scientific board of the CSCA. The Association organizes conferences, seminars, schools and other activities in the field of X-
ray and neutron diffraction in Czech and Slovak Republics. V. Valvoda is a member of the International Centre for Diffraction Data (ICDD), Newtown Square, Pennsylvania, USA, and the member of the Steering Committee of the International X-ray Analysis Society (IXAS).Main meetings in 1999: Struktura'99 - Colloquium of the Czech and Slovak Crystallographic Association, Hodonín u Kunštátu, June 1999. Regional Powder Diffraction Conference, RPDK'99, Liptovský Mikuláš, September 1999.
Editorial office of the CSCA is located in our department (members R. Kužel, L. Dobiášová). R. Kužel is the editor of the journal Materials Structure in Chemistry, Biology, Physics and Technology.
Publications in 1999: Materials Structure, vol. 6, no. 1, 2; ECM-18 CD-ROM
Last page modification : 3. 3. 2000
Webmaster