MS details

The schedule is available at https://www.conftool.com/iucr2020/

Combination of X-rays and electrons for structure characterization

Comments

If a single crystal of adequate size and quality is available, single-crystal X-ray diffraction is the method of choice for structure analysis. However, if such crystals are not available, powder X-ray diffraction and electron crystallography provide a viable alternative. Structure analysis from X-ray powder diffraction data are hampered by reflection overlap, but the diffraction process is kinematic, so the reflection intensities are easily interpreted. Electron diffraction data do not suffer from reflection overlap, but the diffraction process is dynamical, and this makes the intensities more difficult to interpret directly. By combining these two techniques, the structures of materials that are difficult to elucidate with either technique alone become accessible.

Chair persons

Name	Family	Institution	City	Country	Region
Junliang	Sun	Beijing University	Beijing	China	AsCA
Joke	Haderman	University of Antwerp	Antwerp	Belgium	ECA

Invited speakers

Name	Family	Institution	City	Country	Title
Stef	Smeets	Technical University Delft	Delft	Netherlands	In the age of electrons, do we still need powder diffraction?
Tatiana	Gorelik	Ulm University	Ulm University	Germany	X-ray powder diffraction and electron single crystal diffraction – two techniques for structure analysis of nanocrystals