MS details

The schedule is available at https://www.conftool.com/iucr2020/

Combining X-ray diffraction and spectroscopy to characterise materials

Comments

Structural and electronic information obtainable from XAS analysis are widely complementary with those from XRPD. XAS provides details about the electronic state, local coordination chemistry and atomic structure around the absorber in the few Å scale, while XRPD describes the crystallographic structure of long range coherent phases. These techniques can be combined to achieve reliable understanding of the physico-chemical properties of complex systems such as natural bio-geo-chemical compounds and novel materials. This symposium could be shared also with the commission on Powder diffraction

Chair persons

Name	Family	Institution	City	Country	Region
Carlo	Meneghini	University of Roma 3	Rome	Italy	ECA
Siegbert	Schmid	University of Sydney	Sydney	Australia	AsCA

Invited speakers

Name	Family	Institution	City	Country	Title
Ilaria	Carlomagno	Elettra Sincrotrone Trieste	Trieste	Italy	Diffraction and Spectroscopy: characterising thin ferromagnetic films from the local scale to the long-range... and beyond
Marco	Giorgetti	University of Bologna	Bolonga	Italy	Structure and charge monitoring of battery materials: long range vs. short range in Prussian Blue Analogous