MS details

The schedule is available at https://www.conftool.com/iucr2020/

Integrative methodologies for novel thin film structures

Comments

This MS will focus on creative strategies for the development and encompassing characterization of novel thin film structures. This combines structural and application-relevant aspects, and includes, e.g., complementary in situ and real-time characterization during deposition and processing (e.g. by surface-sensitive x-ray, neutron, or electron scattering and spectroscopy methods), and efficient screening approaches for large material libraries.

Chair persons

Name

Family

Institution

City

Country

Region

David

Babonneau

University of Poitiers

Futuroscope

France

ECA

Baerbel

Krause

Karlsruhe Institute of Technology

Karlsruhe

Germany

ECA

 

Invited speakers

Name

Family

Institution

City

Country

Title

Jolien

Dendooven

University of Ghent

Ghent

Belgium

 In situ study of noble metal atomic layer deposition processes using grazing incidence small angle X-ray scattering

Byeongdu

Lee

Argonne National Laboratory

Argonne

USA

 Symmetry-breaking in double gyroid block copolymer film