| Sunday, September 5 |  |
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B8 Chairs: Stanislaw Skrzypek, Udo Welzel |
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| 13.30 | Christoph
Schug Naomi Technologies, Mainz, Germany |
X-ray analysis of thin film structures used in magnetic sensors and magnetic media |
| 14.00 |
Grzegorz Gladyszewski
Politechnical University in Lublin, Poland |
Small and large angle X-ray diffraction in metallic multilayers |
| 14.30 | Paul
F Fewster PANalytical Research Centre, Sussex, Science Park Square, Falmer, Brighton, U.K. |
Microstructure determination as a function of depth in thin multilayer structures |
| 14.50 |
Harm
Wulf University of Greifswald, Germany |
In situ studies of diffusion and crystallization processes in thin ITO films by temperature and time resolved grazing incidence X-ray diffractometry |
| 15.10 |
Atul
Kumar Max Planck Institute for Metals Research, Stuttgart, Germany |
Diffraction Stress Analysis of Strongly Fibre-Textured Au Layers |
| Sunday, September 5 | |