A8 - Surfaces, Thin Layers, Epitaxial Thin Films

Chair: Vaclav Holy (Czech Republic), Co-chair: Matej Jergel (Slovakia)

15.45 U. Pietsch, N. Darowski, K.H. Wang, A. Forchel, Q. Shen, S. Kycia X-Ray Diffraction Analysis of Free Standing and Overgrown Surface Nanostructures A
16.25 T. Baumbach, D. Luebbert, L. Leprince, J. Schneck, A. Talneau, R. Felici, A. Mazuelas Strain Relaxation in Surface and Buried III-V Multilayer Gratings Studied by High-Resolution XRD and Elasticity Theory A
16.45

Break
17.10 A. Ulyanenkov, N. Darowski, U. Pietsch, T. Baumbach, K.H. Wang, A. Forchel Grazing Incidence X-Ray Diffraction from Semiconductor Quantum Wires A
17.30 R. Terborg, J.T. Hoeft, R. Lindsay, O. Schaff, M. Polcik, A.M. Bradshaw, R. Toomes, N.A. Booth, D.P. Woodruft, J. Denlinger, E. Rotenberg Adsorption of Carbon on Ni{100} Studied by Scanned-Energy Mode Photoelectron Diffraction A
17.50 J. Bak-Misiuk, J. Adamczewska, J. Domagala, Z.R. Zytkiewicz, A. Misiuk, H.B. Surma Dependence of Defect Structure of Semiconductor Thin Layers on Pressure Annealing A
18.10