A7 - Thin Film and Multilayers

Chair: H Goebel (Germany), Co-chair: Vaclav Valvoda (Czech Republic)

10.00 H. Goebel How Essential will X-Ray Methods Be for the Future of Semiconductor Technology A
10.20 S. Di Fonzo Experiments with Resonantly Enhancing Standing Waves in Thin Film Systems A
10.40 K. Temst, M.J. Van Bael, V.V. Moshchalkov, C. Van Haesendonck, Y. Bruynseraede Structural Characterization of Multilayered Nanostructures by X-Ray Diffraction and Scanning Probe Microscopy A
11.00

Break
11.30 B. Gilles Stress, Strain and Interdiffusion in Au/Ni Epitaxied Multilayers A
11.50 D. Rafaja Local Ordering in Multilayers as Seen by X-Ray Diffraction A
12.10 H. Wern Dependence of the X-Ray Elastic Constants on the Diffraction Plane for Polycrystalline Cubic, Hexagonal and Tetragonal Thin Films with Any Fiber Axis A
12.30 R. Schwarzer Automated Crystal Orientation Mapping (ACOM) - A New Perspective on the Characterization of Microstructure A