ADVANCED TECHNOLOGIES FOR NEXT-GENERATION CCD DETECTORS

R.D. Durst1 and L. Häming2

1 Bruker-AXS Inc., 6300 Enterprise Lane, Madison, WI 53719 Email: rdurst@bruker-axs.com
2 Bruker-AXS GmbH, Rheinbrückenstr, 76181 Karlsruhe Email: ludger.haeming@bruker-axs.de

 

A critical component of every CCD-based X-ray imager is the phosphor screen which converts the incident X-ray flux to visible light.

The characteristics of an ideal X-ray phosphor include:

The characteristics of commercially available X-ray phosphors are discussed with particular attention given to lanthanide-doped Gd2O2S (which has become the de-facto standard for CCD-based X-ray imaging). However, Gd2O2S was originally developed as an intensifier for ortho film and hence its time response, spectral output and conversion efficiency are not optimal for CCD imaging.

The need for X-ray phosphors, which are specifically optimised for CCD detectors has been recognised for some time.

Here we report on studies of the underlying physical limits to X-ray phosphor performance and the development of a new class of X-ray phosphors, which exhibit: