STRUCTURAL STUDY OF METAL-METALLOID AND METAL-METAL MULTILAYERS
T. Pusztai1,
J. Balogh2, L. Bujdosó2,
L. Tóth3
1 Department of Solid
State Physics, Eötvös Loránd University, H-1088 Budapest,
Múzeum krt. 6-8, Hungary
2 Research Institute
for Solid State Physics, H-1525 Budapest, P.O.Box 49, Hungary
3 Research Institute
for Technical Physics, H-1525 Budapest, P.O.Box 49 Hungary
Multilayers are used in more and
more areas of technology. In order to control the physical
parameters of these layers, it is crucial to know their
structure, both in the mesoscopic and in the atomic level. In
this study we report structural studies on metal-metalloid and
metal-metal multilayers using a combination of several methods,
such as grazing incident x-ray diffraction, Mössbauer
spectroscopy, and transmission electron microscopy. In the
investigated multilayers an amorphous interface is formed between
the elemental layers during the sample deposition. We show that
local methods like Mössbauer spectroscopy give unique
information on the concentration distribution in the amorphous
phase, which cannot be obtained from diffraction experiments.
Although precise atomic positions cannot be determined, the
mesoscopic structure can be characterized, and the results of the
three types of measurements can be explained in a coherent model.