KOSSEL LINES, STANDING WAVES, AND X-RAY FLUORESCENCE HOLOGRAPHY

S. Marchesini¹, M. Belakhovsky¹, G. Faigel², M. Tegze²

¹ Departement de Recherche Fondamentale sur la Matie`re Condense´ (SP2M/IRS), CEA, Grenoble 38054 Cedex 9 France.
² Research Institute for Solid State Physics, Budapest POB 49 Hungary 

X-ray fluorescent holography is an emerging field for structural studies. We measured the flourescent intensity as a function of either the incident beam direction (inverse holography) or the detector position (normal holography). Long  (Kossel and XSW lines) and short (atomic holograms) range information were  retrieved from the fluorescent intensity distributions. The problems of data analysis  are also discussed.