TIME-RESOLVED DIFFRACTION STUDIES IN MATERIALS SCIENCE USING SYNCHROTRON RADIATION

A.Kvick

European Synchrotron Radiation Facility BP.220,38043 Grenoble Cedex,France

Keywords: Time-resolved diffraction,synchrotron radiation,materials science

Time-resolved diffraction using synchrotron radiation has progressed rapidly during the last few years mainly due to the development of very stable and high-flux X-ray sources at the third generation synchrotron facilities in combination with developments of new area detector systems such as CCD detectors or imaging plate equipment suitable to diffraction applications. New research problems are presently being initiated in the field of time-resolved diffraction.. This presentation will mainly concentrate on the time-resolved diffraction facilities at the ID11 Materials Science beam-line at the ESRF, where two insertion device provide the X rays. The users may choose from a 24-pole wiggler or a 94-pole minigap undulator to obtain a suitable X-ray wavelength anywhere in the region 0.1-2 A. Several detector systems are used at the beam-line including the Bruker SMART CCD system, imaging intensifier CCD systems and Molecular Dynamics image plate scanners.The talk will present several examples from recent applications in materials science.