Nanocrystalline Materials

Chair: Hans Eckhard Schaefer (Germany), Co-chair: Karl-Heinz Ehses (Germany)

H. Gleiter Structure and Related Properties of Nanocrystalline Materials A
C. Vazquez-Vazquez, M.A. Lopez-Quintela, R.D. Sanchez, J. Rivas Effects of Particle Size on the Properties of La0.67Ca0.33MnO3+d Nanoparticles Prepared by the Sol-Gel Method A
C.E. Krill Characterization of Nanocrystalline Materials by X-Ray Diffraction A
W.M. Straub, F. Phillipp, and H.-E. Schaefer Orientational relationships, interfaces and grain growth in Nanocrystalline Palladium by high-resolution and dark-field electron microscopy A
I.V. Alexandrov, R.Z. Valiev Characterization of Nanostructured Materials Processed by Severe Plastic Deformation A

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C.E. Krill

C.E. Krill

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W.M. Straub

C. Vazquez-Vazquez

H. Gleiter, who initiated pioneering work in this field, reviewed the theoretical and experimental information available for the structure of interfaces which may deviate at grain sizes of crystallites with a few nanometers from that of conventional grain boundaries and gave an overview of the application of nanocrystalline materials. C.E. Krill comprehensively discussed the field of x-ray diffraction for the structural analysis of nanoscaled solids as grain sizes, strains and atomic displacements underlining the potentials provided by synchrotron radiation. In oral contributions the effects of particle size on the properties of nanomaterials were discussed in the case of LaCuMnO3 with the influence on ferromagnetism and magnetoresistivity (C. Vazquez- Vazquez). In addition, an introduction into the application of atomic resolution electron microscopy for the investigation of grain boundaries and orientation correlationship of nanocrystallites was presented (W.M. Straub). Finally the preparation of fully dense nanostructured materials processed by severe plastic deformation was discussed (I.V. Alexandrov). The main features of the poster session were focussed on the structural properties of nanocrystalline metals, ceramics and ferrites studied by diffraction techniques and modelling approaches.

H. Schaefer, Chair