Thin Film and Multilayers

H. Goebel	How Essential will X-Ray Methods Be for the Future of Semiconductor Technology (video)	A
S. Di Fonzo	Experiments with Resonantly Enhancing Standing Waves in Thin Film Systems	A
K. Temst, M.J. Van Bael, V.V. Moshchalkov, C. Van Haesendonck, Y. Bruynseraede	Structural Characterization of Multilayered Nanostructures by X-Ray Diffraction and Scanning Probe Microscopy	A
B. Gilles	Stress, Strain and Interdiffusion in Au/Ni Epitaxied Multilayers	A
D. Rafaja	Local Ordering in Multilayers as Seen by X-Ray Diffraction	A
H. Wern	Dependence of the X-Ray Elastic Constants on the Diffraction Plane for Polycrystalline Cubic, Hexagonal and Tetragonal Thin Films with Any Fiber Axis	A
R. Schwarzer	Automated Crystal Orientation Mapping (ACOM) - A New Perspective on the Characterization of Microstructure	A