PrOW : A PROGRAM FOR DATA INTEGRATION BASED ON PROFILE FITTING FOR THE EVALUATION OF WEAK AND/OR OVERLAPPED 2-DIMENSIONAL DIFFRACTION PATTERNS

D. Bourgeois1,2, D. Nurizzo3, R. Kahn2, & C. Cambillau3

1 ESRF, France
2LCCP, IBS, Grenoble, France
3AFMB, CNRS, Marseille, France.
email : bourgeoi@esrf.fr

Keywords : macromolecular crystallography, data processing, profile-fitting, overlap deconvolution.

We propose a new technique based on profile fitting for the integration of weak and/or spatially overlapped 2D diffraction patterns [1]. An associated software package with a GUI interface, named PROW (PRofile fitting for Overlapped and Weak data) has been developped. Either Laue or monochromatic data can be processed. Indexation is performed with LAUEGEN [2] or with the DENZO package [3]. Integration uses box integration with optimized summation area for strong, non overlapped spots, and profile fitting with optimized profile fitting area for weak and/or overlapped spots. Integration areas are dynamically adjusted to match the spot shape and obtain the best compromise between minimal bias resulting from statistical fluctuations of the X-ray background, and maximal use of the information content in each diffraction spot. Deconvolution of spatially overlapped spots, a frequent problem in Laue diffraction, and not so rare in the case of monochromatic data collection, is performed by a standard least-square procedure. Fourier interpolation of reference profiles is used to overcome effects of discrete data sampling. Masks of any shape can be applied to prevent processing of spurious image areas. Ice spots and obvious outliers are automatically removed. The program has been tested on several data sets recorded on image plate and CCD detectors. Results obtained from very weak Laue data sets, containing as many as 60 % overlapped spots, and from difficult monochromatic data sets will be shown. Observed improvements in statistical factors (Rsym, I/SigI, redundancy, completeness) resulted in density maps and atomic model refinement of superior quality.

[1] Bourgeois, D., Nurizzo, D., Kahn, R. & Cambillau, C. (1998), J. Appl. Cryst. 31, 22-35.
[2] Campbell, J.W. (1993). Laue Software Suite, CCLRC Daresbury Laboratory, Warrington, England.
[3] Otwinowsky, Z. (1993). in Proceedings of the CCP4 Study Weekend, Daresbury Laboratory, Warrington, England, 56-62.