TIME-RESOLVED DIFFRACTION STUDIES IN MATERIALS SCIENCE USING SYNCHROTRON RADIATION
A.Kvick
European Synchrotron
Radiation Facility BP.220,38043 Grenoble Cedex,France
Keywords: Time-resolved
diffraction,synchrotron radiation,materials science
Time-resolved diffraction using synchrotron
radiation has progressed rapidly during the last few years mainly
due to the development of very stable and high-flux X-ray sources
at the third generation synchrotron facilities in combination
with developments of new area detector systems such as CCD
detectors or imaging plate equipment suitable to diffraction
applications. New research problems are presently being initiated
in the field of time-resolved diffraction.. This presentation
will mainly concentrate on the time-resolved diffraction
facilities at the ID11 Materials Science beam-line at the ESRF,
where two insertion device provide the X rays. The users may
choose from a 24-pole wiggler or a 94-pole minigap undulator to
obtain a suitable X-ray wavelength anywhere in the region 0.1-2
A. Several detector systems are used at the beam-line including
the Bruker SMART CCD system, imaging intensifier CCD systems and
Molecular Dynamics image plate scanners.The talk will present
several examples from recent applications in materials science.